VDI Status Report ‘Machine Learning and AI’

With the new status report ‘Machine Learning – Artificial Intelligence with Neural Networks in Optical Measuring and Testing Systems’, the VDI wants to introduce machine learning for optical measuring and testing systems and present the potentials of machine learning.

Bild: MVTec Software GmbH

The complete report is available free of charge behind the link.

Author:
www.vdi.de/ueber-uns/presse/publikationen/details/kuenstliche-intelligenz-mit-neuronalen-netzen-in-optischen-mess-und-pruefsystemen

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Figure 1 | By processing a thin-film multilayer stack with photoactive layer sensitive in the infrared range (r.), on top of a Silicon readout circuitry (ROIC), Imec creates an IR-sensitive CMOS imager (l.) that’s compatible with mass manufacturing. (Image: Imec)
Figure 1 | By processing a thin-film multilayer stack with photoactive layer sensitive in the infrared range (r.), on top of a Silicon readout circuitry (ROIC), Imec creates an IR-sensitive CMOS imager (l.) that’s compatible with mass manufacturing. (Image: Imec)
Si-based CMOS imagers to detect SWIR wavelengths above 1µm
Si-based CMOS imagers to detect SWIR wavelengths above 1µm

Thin-film photodetectors Si-based CMOS imagers to detect...

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