At the SPS trade fair in Nuremberg (Germany) at the end of November, the main focus was on automation. However, there were also numerous interesting innovations on the subject of machine vision, which were shown there for the first time and will be presented below.

Thanks to a cross-departmental effort involving material development, semiconductor processing skills, system-level design and much more, imec has realized breakthroughs in the capabilities of silicon-based CMOS imagers to detect short-wave infrared (SWIR) wavelengths above one micrometer.