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Si-based CMOS imagers to detect SWIR wavelengths above 1µm

Thanks to a cross-departmental effort involving material development, semiconductor processing skills, system-level design and much more, imec has realized breakthroughs in the capabilities of silicon-based CMOS imagers to detect short-wave infrared (SWIR) wavelengths above one micrometer.

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Bild: EMVA
Bild: EMVA
Vision Standards Meeting in Montreal
Vision Standards Meeting in Montreal

Vision Standards Meeting in Montreal The next International Vision Standards Meeting will be held in Montreal, Canada, May 25 to 29 and is organized by Matrox Imaging. During the IVSM, work will be done on existing standardization projects such as GenICam, GigE...