Oct 15, 2019 | Allgemein, Topstory

Colorful

Color Inspection System for In-line Measurements

The FD-D8R is an advanced spectrophotometer designed for in-line color measurement applications. It incorporates multiple miniaturized spectrometers to provide both Specular Component Included (SCI) and Specular Component Excluded (SCE) reflectance measurements.

Image: Ocean Insight

Notably, the system can perform specular reflectance included and excluded measurements simultaneously and at the same point in space, whereas other sensors typically require moving parts and multiple readings to accomplish this, which adds to cycle time and system complexity. This makes the FD-D8R both fast and flexible across different types of surfaces. The sensor includes illumination, detectors, control electronics and software, all integrated into a miniaturized, rugged package. The system can be further customized to different color metrology requirements. Its rugged design ensures that it is robust in an industrial environment. The built-in integrating sphere is sealed against water and chemical intrusion using a replaceable, cleanable sapphire window. The sensor head presents a small footprint that can easily fit on an assembly line and measure small or hard to reach parts. It is also light enough that it can be mounted easily on stages (fixtures) or robots. The sensor head is coupled to a control module via a single, high-flex cable, rather than fiber optics sensitive to bend radius. Most important, its measurements are non-contact, meaning the sensor head can take measurements from up to 2mm away from the sample. This prevents damage to or marring of the sample from the sensor touching it. The closed-sphere, non-contact design allows for laboratory-grade measurements in a factory environment. The FD-D8R sensor package is operated using software built with automation as its focus. The sensor interfaces via USB with a computer, on which a TCP/IP server provides connectivity to the customer’s software or PLC. A complete measurement, including illumination/integration, readout, and all calculations, can be performed in under 100ms. This means the sensor is a true in-line solution that enables throughputs of hundreds of thousands of parts per day, making 100% inspection possible. Also, the system correlates with existing benchtop laboratory instruments, ensuring that tolerances will be matched across lines and sites.

Author:
www.oceaninsight.com

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Figure 1 | By processing a thin-film multilayer stack with photoactive layer sensitive in the infrared range (r.), on top of a Silicon readout circuitry (ROIC), Imec creates an IR-sensitive CMOS imager (l.) that’s compatible with mass manufacturing. (Image: Imec)
Figure 1 | By processing a thin-film multilayer stack with photoactive layer sensitive in the infrared range (r.), on top of a Silicon readout circuitry (ROIC), Imec creates an IR-sensitive CMOS imager (l.) that’s compatible with mass manufacturing. (Image: Imec)
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