Thanks to a cross-departmental effort involving material development, semiconductor processing skills, system-level design and much more, imec has realized breakthroughs in the capabilities of silicon-based CMOS imagers to detect short-wave infrared (SWIR) wavelengths above one micrometer.
Figure 1 | By processing a thin-film multilayer stack with photoactive layer sensitive in the infrared range (r.), on top of a Silicon readout circuitry (ROIC), Imec creates an IR-sensitive CMOS imager (l.) that’s compatible with mass manufacturing. (Image: Imec)
Figure 1 | By processing a thin-film multilayer stack with photoactive layer sensitive in the infrared range (r.), on top of a Silicon readout circuitry (ROIC), Imec creates an IR-sensitive CMOS imager (l.) that’s compatible with mass manufacturing. (Image: Imec)
